ANSI ESD STM 5.5.1:2016 pdf download.Electrostatic Discharge Sensitivity Testing -Transmission Line Pulse (TLP)- Device Level.
The scope and focus of this document pertains to TLP testing techniques of semiconductor components. The focus of the document is on quasi-static application of TLP testing techniques. however the techniques can also be applied to study transient behavior of semiconductor corn ponents.
1.3 Application
The term VF-TLP is used for very short pulses (S 10 ns). consistent with the definition of this term in this document, and standard TLP for longer pulses (10 ns < pulse duration <= 200 ns). The term long pulse TLP is used when discussing pulses longer than 200 ns pulse length and where special considerations need to be taken into account due to the long pulse length. To indicate a TLP setup with a specific pulse duration we will use terminology like 100 ns-TLP (for TLP using 100 ns pulses); 1 ns-TLP (for TLP using 1 ns pulses), etc. Therefore, previous versions of ANSI/ESD STM5.5.1 (2014 and older) typically dealt with 100 ns-TLP, while ANSI/ESD SP5.5.2 (VF-TLP) dealt with TLP systems ranging from 1 ns-TLP to 10 ns-TLP. The requirements for the equipment and procedures described in this document have been demonstrated to produce repeatable results for quasi-static TLP on different structures in different labs. The results were published in ESD TR5.5-02-08 and ESD TR5.5-03-14. For specific applications and/or practical reasons useful results may be achieved with parts of the equipment not fully meeting these requirements. If such results are reported, the limitations of the equipment used need to be documented and the results will not be compliant with this STM. 2.0 REFERENCED DOCUMENTS Unless otherwise specified, the following documents of the latest issue, revision or amendment, form a part of this standard to the extent specified herein: ESD ADV1 .0, ESD Association Glossary of Terms ANSI/ESD S20.20, Protection of Electrical and Electronic Parts, Assemblies and Equipment (Excluding Electrically Initiated Explosive Devices) IEC 61 340-5-1 — Electrostatics — Part 5-1: Protection of electronic devices from electrostatic phenomena — General Requirements JESD625 — Requirements for handling Electrostatic-Discharge-Sensitive (ESDS) Devices 3.0 DEFINITIONS The terms used in the body of this document are in accordance with the definitions found in ESD ADVI .0, ESD Association’s Glossary of Terms available for complimentary download at www.esda.org. transmission line pulse (TLP). A rectangular current pulse formed by discharging a charged transmission line cable. transmission line pulse test system. A test system that applies a transmission line pulse to a device under test (DUT) and allows measurement of device electrical characteristics during a pulsed state.ANSI ESD STM 5.5.1 pdf download.